- Patent Title: CT inspection system and CT imaging method for obtaining detection data at a frequency that is N times a beam-emitting frequency of a radioactive source device
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Application No.: US16234625Application Date: 2018-12-28
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Publication No.: US10935691B2Publication Date: 2021-03-02
- Inventor: Kejun Kang , Jianmin Li , Xiulin Ni , Yulan Li , Yuanjing Li , Zhiqiang Chen , Li Zhang , Liang Li , Xiang Zou , Weifeng Yu , Hejun Zhou , Chunguang Zong
- Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing; CN Beijing
- Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing; CN Beijing
- Agency: Kilpatrick Townsend & Stockton, LLP
- Priority: CN201711451912.0 20171228
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01N23/046

Abstract:
The present disclosure relates to the technical field of CT detection, and in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure comprises a radioactive source device, a detection device, a rotation monitoring device and an imaging device, wherein the detection device obtains detection data at a frequency that is N times a beam emitting frequency of the radioactive source device; the rotation monitoring device detects a rotation angle of the detection device and transmits a signal to the imaging device each time the detection device rotates by a preset angle; the imaging device determines a rotational position of the detection device each time the radioactive source device emits a beam according to the signal transmitted by the rotation monitoring device and the detection data of the detection device.
Public/Granted literature
- US20190204243A1 CT INSPECTION SYSTEM AND CT IMAGING METHOD Public/Granted day:2019-07-04
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