Invention Grant
- Patent Title: Method to determine the topological charge of an optical beam
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Application No.: US16373740Application Date: 2019-04-03
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Publication No.: US10935803B2Publication Date: 2021-03-02
- Inventor: Enrique Jose Galvez , Behzad Khajavi
- Applicant: Enrique Jose Galvez , Behzad Khajavi
- Applicant Address: US NY Hamilton; US TX Houston
- Assignee: Enrique Jose Galvez,Behzad Khajavi
- Current Assignee: Enrique Jose Galvez,Behzad Khajavi
- Current Assignee Address: US NY Hamilton; US TX Houston
- Agency: Bond Schoeneck & King, PLLC
- Agent George McGuire
- Main IPC: G02B27/14
- IPC: G02B27/14 ; G02B21/36 ; G02B23/14 ; G02B27/09

Abstract:
An apparatus for determining a topological charge of one of more optical beams. For single beams, a trapezoidal optical element having a front face and an opposing rear face that is not parallel to the front face is oriented so that the optical beam is reflected in a direction other than along the optical path. The reflection of the optical beam by the trapezoidal optical element produces an interference pattern that can be captured by an optical imager and that can be decoded to determine the topological charge of the optical beam. For a plurality of superpositioned beams, an air spaced trapezoidal optical element may oriented to reflect the plurality of beams onto an optical imager to capture the interference pattern. The interference pattern may be interpreted to identify the topological charge of each of the plurality of optical beams.
Public/Granted literature
- US20190310484A1 METHOD TO DETERMINE THE TOPOLOGICAL CHARGE OF AN OPTICAL BEAM Public/Granted day:2019-10-10
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