Invention Grant
- Patent Title: Method and apparatus for identifying and reporting faults at an information handling system
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Application No.: US16012324Application Date: 2018-06-19
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Publication No.: US10936460B2Publication Date: 2021-03-02
- Inventor: Craig L. Chaiken , Matthew G. Page , Michael W. Arms , Dustin A. Combs , Chun Yi (Jadis) Yang
- Applicant: DELL PRODUCTS, LP
- Applicant Address: US TX Round Rock
- Assignee: DELL PRODUCTS, LP
- Current Assignee: DELL PRODUCTS, LP
- Current Assignee Address: US TX Round Rock
- Agency: Larson Newman, LLP
- Main IPC: G06F11/273
- IPC: G06F11/273 ; G06F21/64 ; G06F21/57 ; G06F11/22
Abstract:
A method includes invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system. A result of the test procedure is displayed at a primary display device using a built in self test function incorporated at the primary display device.
Public/Granted literature
- US20190384684A1 Method and Apparatus for Identifying and Reporting Faults at an Information Handling System Public/Granted day:2019-12-19
Information query
