Invention Grant
- Patent Title: Systems and methods of feature correspondence analysis
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Application No.: US16022074Application Date: 2018-06-28
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Publication No.: US10937150B2Publication Date: 2021-03-02
- Inventor: Huan Tan , Arpit Jain , Gyeong Woo Cheon , Ghulam Ali Baloch , Jilin Tu , Weina Ge , Li Zhang
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/73 ; G06K9/62 ; G06T7/20 ; G06K9/46

Abstract:
A method and system, the method including receiving semantic descriptions of features of an asset extracted from a first set of images; receiving a model of the asset, the model constructed based on a second set of a plurality images of the asset; receiving, based on an optical flow-based motion estimation, an indication of a motion for the features in the first set of images; determining a set of candidate regions of interest for the asset; determining a region of interest in the first set of images; iteratively determining a matching of features in the set of candidate regions of interest and the determined region of interest in the first set of images to generate a record of matches in features between two images in the first set of images; and displaying a visualization of the matches in features between two images in the first set of images.
Public/Granted literature
- US20200005444A1 SYSTEMS AND METHODS OF FEATURE CORRESPONDENCE ANALYSIS Public/Granted day:2020-01-02
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