Invention Grant
- Patent Title: Method of fabricating integrated circuit
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Application No.: US16868495Application Date: 2020-05-06
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Publication No.: US10937830B2Publication Date: 2021-03-02
- Inventor: Chin-Chun Huang , Yun-Pin Teng , You-Di Jhang , Wen Yi Tan
- Applicant: United Semiconductor (Xiamen) Co., Ltd.
- Applicant Address: CN Fujian
- Assignee: United Semiconductor (Xiamen) Co., Ltd.
- Current Assignee: United Semiconductor (Xiamen) Co., Ltd.
- Current Assignee Address: CN Fujian
- Agent Winston Hsu
- Priority: CN201811478155.0 20181205
- Main IPC: H01L27/24
- IPC: H01L27/24 ; H01L45/00

Abstract:
An integrated circuit includes: a substrate having a resistive random-access memory area and a resistor area; a first dielectric layer and a second dielectric layer sequentially disposed on the substrate; a patterned stacked structure having a bottom conductive layer, an insulating layer and a top conductive layer stacked from bottom to top sandwiched by the first dielectric layer and the second dielectric layer; a first metal plug and a second metal plug disposed in the second dielectric layer and contacting the top conductive layer and the bottom conductive layer of the resistive random-access memory area respectively, thereby constituting a resistive random-access memory cell; and, a third metal plug and a fourth metal plug disposed in the second dielectric layer and contacting the bottom conductive layer or the top conductive layer of the resistor area, thereby constituting a resistor cell. A method of forming said integrated circuit is also provided.
Public/Granted literature
- US20200266237A1 METHOD OF FABRICATING INTEGRATED CIRCUIT Public/Granted day:2020-08-20
Information query
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