Invention Grant
- Patent Title: Source/drain feature to contact interfaces
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Application No.: US16276833Application Date: 2019-02-15
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Publication No.: US10937876B2Publication Date: 2021-03-02
- Inventor: Ding-Kang Shih , Sung-Li Wang , Pang-Yen Tsai
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L29/78 ; H01L29/08 ; H01L29/66 ; H01L21/02 ; H01L21/762 ; H01L21/8238 ; H01L27/092 ; H01L29/165

Abstract:
Examples of an integrated circuit with an interface between a source/drain feature and a contact and examples of a method for forming the integrated circuit are provided herein. In some examples, a substrate is received having a source/drain feature disposed on the substrate. The source/drain feature includes a first semiconductor element and a second semiconductor element. The first semiconductor element of the source/drain feature is oxidized to produce an oxide of the first semiconductor element on the source/drain feature and a region of the source/drain feature with a greater concentration of the second semiconductor element than a remainder of the source/drain feature. The oxide of the first semiconductor element is removed, and a contact is formed that is electrically coupled to the source/drain feature. In some such embodiments, the first semiconductor element includes silicon and the second semiconductor element includes germanium.
Information query
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