- Patent Title: System and method for measuring free-space parameters of an antenna
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Application No.: US16826424Application Date: 2020-03-23
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Publication No.: US10938488B2Publication Date: 2021-03-02
- Inventor: Michael W. Howard
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R31/11 ; G01R35/00 ; H04B17/10 ; G01R29/10
Abstract:
Disclosed is a system for measuring free space properties of an antenna. The system includes an analyzer adapted to obtain from an antenna supported in the air by an aircraft, at least one property of the antenna, and to determine at least one property of the antenna. The system also includes a telemetry unit adapted to relay information from the analyzer to a ground station.
Public/Granted literature
- US20200220627A1 SYSTEM AND METHOD FOR MEASURING FREE-SPACE PARAMETERS OF AN ANTENNA Public/Granted day:2020-07-09
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