Invention Grant
- Patent Title: Computing element failure identification mechanism
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Application No.: US16168821Application Date: 2018-10-23
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Publication No.: US10938623B2Publication Date: 2021-03-02
- Inventor: Pavan Belur Gopalakrishna Upadhya , Vinay Sahadevappa Banakar , Maneesh Keshavan Bendiganavale , Naveena Kedlaya
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- Main IPC: G06F11/00
- IPC: G06F11/00 ; H04L12/24 ; G06F11/07 ; G06Q10/06 ; G06N5/02 ; G06N20/00
Abstract:
In an example, a first graph representing a first set of combinations of computing elements and logical elements used in a computing environment is compared with a second set of combinations of computing elements and logical elements. The first set of combinations includes a plurality of element combinations. The comparison may be performed to identify a potentially faulty element combination among the first set of combinations.
Information query
