Invention Grant
- Patent Title: Measurement method for micro topography and roughness of internal surface of gap
-
Application No.: US16636491Application Date: 2018-06-27
-
Publication No.: US10942025B2Publication Date: 2021-03-09
- Inventor: Jiang Guo , Shujie Liu , Renke Kang , Dongming Guo
- Applicant: DALIAN UNIVERSITY OF TECHNOLOGY
- Applicant Address: CN Dalian
- Assignee: DALIAN UNIVERSITY OF TECHNOLOGY
- Current Assignee: DALIAN UNIVERSITY OF TECHNOLOGY
- Current Assignee Address: CN Dalian
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- International Application: PCT/CN2018/093078 WO 20180627
- International Announcement: WO2020/000249 WO 20200102
- Main IPC: G01B15/08
- IPC: G01B15/08 ; G01B11/30 ; G01B21/30

Abstract:
A measurement method for micro topography and roughness of internal surface of gap belongs to the technical field of precision measurement and is realized based on a measurement system which comprises a PC, a controller, a flexible mechanism and a measurement thin film. The measurement thin film has a copy function and is bonded to the flexible mechanism. The PC is connected with the flexible mechanism through the controller to control the flexible mechanism to expand or contract. The measurement method can effectively solve the measurement problem of the micro topography and surface roughness of the internal surface of the gap with a narrow inlet size. The method is simple and easy to operate, and the device is easy to carry, low in cost and high in measurement accuracy.
Public/Granted literature
- US20200249015A1 MEASUREMENT METHOD FOR MICRO TOPOGRAPHY AND ROUGHNESS OF INTERNAL SURFACE OF GAP Public/Granted day:2020-08-06
Information query