Invention Grant
- Patent Title: Temperature measurement apparatus
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Application No.: US15889899Application Date: 2018-02-06
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Publication No.: US10942069B2Publication Date: 2021-03-09
- Inventor: Akira Kubo
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JPJP2017-210031 20171031
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01K7/02 ; G01K7/13

Abstract:
There is provided a temperature measurement apparatus that differentiates temperature-measurement resolutions and temperature-calculation accuracies in accordance with the difference of the temperature-measurement range so as to make it possible to universalize temperature-calculation processing among two or more models having different temperature-measurement ranges. In a temperature measurement apparatus, for respective identifiers indicating models of an A/D conversion circuit, a temperature calculation circuit stores corresponding polynomials whose powers and the coefficients of the powers are different from one another, and calculates a temperature by use of the polynomial having the powers and the coefficients of the powers corresponding to the identifier for the A/D conversion circuit that is actually provided.
Public/Granted literature
- US20190128746A1 TEMPERATURE MEASUREMENT APPARATUS Public/Granted day:2019-05-02
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