Invention Grant
- Patent Title: Particle characterization apparatus and method
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Application No.: US16485226Application Date: 2018-02-14
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Publication No.: US10942106B2Publication Date: 2021-03-09
- Inventor: Qiu Shi Zhang , Shuang Chen
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Priority: WOPCT/CN2017/000178 20170216,EP17167228 20170420
- International Application: PCT/EP2018/053718 WO 20180214
- International Announcement: WO2018/149889 WO 20180823
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N15/14

Abstract:
An apparatus is provided for determining particle characteristics, in which a flow path is generated containing particles to be analyzed. A light detection system detecting light received from a measurement zone which has been scattered by the particles. A time duration for which a particle remains in the measurement zone is measured to determine an effective aerodynamic particle diameter and a peak detected received light intensity is measured to determine an effective optical particle diameter. A further particle parameter is also obtained relating to the shape and/or density of the particle. This approach enables more information than only a particle size to be obtained using a single-stage optical analysis system. The additional information may be used to characterize the particles more accurately.
Information query