Invention Grant
- Patent Title: Atomic absorption spectrophotometer and atomic absorption measurement method
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Application No.: US16641816Application Date: 2017-08-31
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Publication No.: US10942114B2Publication Date: 2021-03-09
- Inventor: Kazuo Sugihara
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- International Application: PCT/JP2017/031307 WO 20170831
- International Announcement: WO2019/043858 WO 20190307
- Main IPC: G01N21/31
- IPC: G01N21/31 ; G01J3/42

Abstract:
A storage unit stores first and second calibration curves. The first calibration curve represents a relationship between an absorbance of a first standard sample for light at a wavelength λ1 and a concentration of a target composition in the first standard sample. The second calibration curve represents a relationship between an absorbance of a second standard sample for light at a wavelength λ2 and a concentration of the target composition in the second standard sample. The second standard sample has a higher concentration than that of the first standard sample. When the absorbance of the unknown sample for the light at the wavelength λ1 is less than a threshold, a concentration measurement processing unit measures a concentration of the target composition in the unknown sample, based on the absorbance of the unknown sample for the light at the wavelength λ1 and the first calibration curve.
Public/Granted literature
- US20200225148A1 ATOMIC ABSORPTION SPECTROPHOTOMETER AND ATOMIC ABSORPTION MEASUREMENT METHOD Public/Granted day:2020-07-16
Information query
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