Invention Grant
- Patent Title: Lithography system and cleaning method thereof
-
Application No.: US16805857Application Date: 2020-03-02
-
Publication No.: US10942459B2Publication Date: 2021-03-09
- Inventor: Sheng-Ta Lin , Li-Jui Chen , Shang-Chieh Chien
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A lithography system and a cleaning method thereof are provided. The lithography system includes a light source generator. The light source generator includes a collector, a droplet generator and a droplet catcher. The droplet generator and the droplet catcher are facing each other, and disposed at a region surrounding the collector. The cleaning method includes: shifting the droplet generator out of the light source generator via a port of the light source generator; inserting a shove assembly into the light source generator via the port; using a borescope attached to the shovel assembly to identify a location of a deposit formed by droplets generated by the droplet generator; using the shovel assembly to remove and collect the deposit; and withdrawing the shovel assembly along with the borescope from the light source generator via the port.
Public/Granted literature
- US20210033990A1 LITHOGRAPHY SYSTEM AND CLEANING METHOD THEREOF Public/Granted day:2021-02-04
Information query
IPC分类: