A semiconductor device includes: a plurality of first sensors that is arranged at predetermined intervals; a first measurement circuit that measures the added value of two or more first detection signals among those output from all the first sensors and outputs a first measurement result; a second measurement circuit that measures the added value of two or more first detection signals that are different from those measured by the first measurement circuit among the first detection signals and outputs a second measurement result; and an analysis circuit that analyzes the position of a detection target on the basis of the first and second measurement results, wherein the first sensors and the first and second measurement circuits are coupled to each other so that combinations of the first and second measurement results differ from each other depending on the position of the detection target.