Invention Grant
- Patent Title: Vertical field effect transistor and semiconductor device including the same
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Application No.: US16816908Application Date: 2020-03-12
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Publication No.: US10944003B2Publication Date: 2021-03-09
- Inventor: Jung-Gun You , Chang-Hee Kim , Sung-Il Park , Dong-Hun Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2017-0116126 20170911
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/66 ; H01L29/06 ; H01L29/10 ; H01L21/8238 ; H01L23/532 ; H01L21/308 ; H01L29/423 ; H01L29/165 ; H01L21/8234

Abstract:
A vFET includes a first impurity region doped with first impurities at an upper portion of the substrate. A first diffusion control pattern is formed on the first impurity region. The first diffusion control pattern is configured to control the diffusion of the first impurities. A channel extends in a vertical direction substantially orthogonal to an upper surface of the substrate. A second impurity region is doped with second impurities on the channel. A second diffusion control pattern is between the channel and the second impurity region. The second diffusion control pattern is configured to control the diffusion of the second impurities. A gate structure is adjacent to the channel.
Public/Granted literature
- US20200220012A1 VERTICAL FIELD EFFECT TRANSISTOR AND SEMICONDUCTOR DEVICE INCLUDING THE SAME Public/Granted day:2020-07-09
Information query
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