Invention Grant
- Patent Title: Device and method for monitoring two-stage faults of TDM-PON with high precision
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Application No.: US16880177Application Date: 2020-05-21
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Publication No.: US10944498B2Publication Date: 2021-03-09
- Inventor: Anbang Wang , Tong Zhao , Yuncai Wang , Bingjie Wang , Peixin He
- Applicant: Taiyuan University of Technology
- Applicant Address: CN Taiyuan
- Assignee: Taiyuan University of Technology
- Current Assignee: Taiyuan University of Technology
- Current Assignee Address: CN Taiyuan
- Agency: Troutman Pepper Hamilton Sanders LLP
- Agent Christopher C. Close, Jr.
- Priority: CN201910443079.8 20190526
- Main IPC: H04J14/08
- IPC: H04J14/08 ; H04J14/02

Abstract:
The present invention discloses a device and a method for monitoring two-stage faults of a TDM-PON with high precision. A two-stage TDM-PON system includes an OLT I, a feeder fiber II, a stage-1 1:n optical splitter III, a stage-1 branch fiber IV, a stage-2 1:n optical splitter V, a stage-2 branch fiber VI, and an optical network unit (ONU) VII. A two-stage optical network monitoring system includes a monitoring part on the OLT I side and a monitoring part on the ONU VII side, where the monitoring part on the OLT I side includes a control-end isolator-free semiconductor laser, a control-end coupler, a control-end optical coupling device, a control-end photodetector, an integrated signal acquisition and processing device, and an optical coupling device; and the monitoring part on the ONU VII side is similar to the monitoring part of the OLT I side.
Public/Granted literature
- US20200374026A1 DEVICE AND METHOD FOR MONITORING TWO-STAGE FAULTS OF TDM-PON WITH HIGH PRECISION Public/Granted day:2020-11-26
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