Invention Grant
- Patent Title: Connector pin device for testing semiconductor chip and method of manufacturing same
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Application No.: US16250101Application Date: 2019-01-17
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Publication No.: US10948520B2Publication Date: 2021-03-16
- Inventor: Jaesuk Oh , Kyungsook Lim
- Applicant: Jaesuk Oh , Kyungsook Lim
- Applicant Address: KR Gwangmyeong-si; KR Guri-si
- Assignee: Jaesuk Oh,Kyungsook Lim
- Current Assignee: Jaesuk Oh,Kyungsook Lim
- Current Assignee Address: KR Gwangmyeong-si; KR Guri-si
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2016-0096642 20160729
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/28 ; G01R1/04 ; G01R1/073

Abstract:
A connector pin device includes a test socket body made of a flexible insulating material and including a pin mounting part in which mounting holes have been formed and a support part supporting the pin mounting part, sliding contact pins respectively formed in the mounting holes and each including a first contact pin having a first end externally exposed and a second end located within the mounting hole and a second contact pin having a first end externally located on the side opposite the first end of the first contact pin and a second end located within the mounting hole, wherein the first and second ends of the first and the second contact pins are provided to slide and come into contact with each other, and an cavity portion formed in a portion where the second ends of the sliding contact pins in the mounting hole are located.
Public/Granted literature
- US20190146005A1 CONNECTOR PIN DEVICE FOR TESTING SEMICONDUCTOR CHIP AND METHOD OF MANUFACTURING SAME Public/Granted day:2019-05-16
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