A measuring device and measuring method for capturing a surface topology of a workpiece uses an optical coherence tomograph having a reference arm guided by a manipulator or a deflection unit to position a measuring region of the scanner. The reference arm is guided along an actual track, which at least partially deviates from an intended track due to disturbing influences like lag errors of the manipulator. An actual distance (dm) between a zero point of the measuring region and a workpiece surface is measured at at least one measuring point of the actual track. A planning path length (Ip) of the reference arm is established for the at least one measuring point for the compensation of the disturbing influences, and the measured actual distance (dm) is normalized to a standard distance (dn) with the aid of the planning path length (Ip).