Invention Grant
- Patent Title: Automatic miller plateau sampling
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Application No.: US16417646Application Date: 2019-05-21
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Publication No.: US10955445B2Publication Date: 2021-03-23
- Inventor: Antoine Fabien Dubois
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: G01R19/165
- IPC: G01R19/165 ; H03K17/687 ; H03M1/12

Abstract:
A system includes a power transistor having a first drain connected to a load, a first gate connected to a gate driver, wherein the gate driver is configured to drive a first gate voltage on the first gate, and a first source connected to a ground. A sampling transistor includes a second drain connected to the first gate, a second gate connected to the first drain and a second source. A sampling capacitor is connected between the second source and the ground, wherein the sampling transistor is configured to sample a Miller plateau voltage of the first gate voltage on the sampling capacitor, in response to the first gate voltage increasing to the Miller plateau voltage and a first drain voltage of the first drain decreasing to a value equal to the Miller plateau voltage plus a threshold voltage of the sampling transistor.
Public/Granted literature
- US20200371139A1 Automatic Miller Plateau Sampling Public/Granted day:2020-11-26
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