Invention Grant
- Patent Title: Radiation measurement device and method
-
Application No.: US16478260Application Date: 2017-12-18
-
Publication No.: US10955565B2Publication Date: 2021-03-23
- Inventor: Masaki Taguchi , Masateru Hayashi , Tetsushi Azuma , Makoto Sasano , Akihide Shiratsuki
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Chiyoda-ku
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-ku
- Agency: Xsensus LLP
- Priority: JPJP2017-076010 20170406
- International Application: PCT/JP2017/045283 WO 20171218
- International Announcement: WO2018/185982 WO 20181011
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/105

Abstract:
Provided are a radiation measurement device and method that allow stable radiation measurement as compared with the prior art. The radiation measurement device includes a radiation detection unit 1 having a scintillator, an optical transmission member 21 for transmitting an optical signal generated in the radiation detection unit, and a signal processing unit 3 for calculating a radiation dose from the optical signal transmitted. The signal processing unit includes a compensation unit 7 for obtaining an optical transmission loss amount from a change in wavelength spectrum in the optical signal caused by radiation acting on the optical transmission member and performs compensation-control on the optical transmission loss amount, and outputs a compensated signal.
Public/Granted literature
- US20200225366A1 RADIATION MEASUREMENT DEVICE AND METHOD Public/Granted day:2020-07-16
Information query