Invention Grant
- Patent Title: Placement-driven generation of error detecting structures in integrated circuits
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Application No.: US16405467Application Date: 2019-05-07
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Publication No.: US10956637B2Publication Date: 2021-03-23
- Inventor: Ashraf ElSharif , Kenneth Douglas Klapproth , Jason D. Kohl
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent William Kinnaman
- Main IPC: G06F30/30
- IPC: G06F30/30 ; G06F30/327 ; G06F117/02

Abstract:
According to one or more embodiments, a method for adding parity protection for any uncovered latches of a circuit design is provided. The method includes determining latches that are not covered by current parity protection of the circuit design to output a list of the uncovered latches. The method includes executing a clustering operation that iteratively generates latch groupings according to physical design information and clock gating domains, and that outputs an updated design incorporating the latch groupings. Note that each latch grouping generates a corresponding parity bit to provide the parity protection to minimize adverse impacts on timing, routing, and power consumption of the circuit design. The method also includes adding the updated design with the parity protection to the circuit design to generate a final hardware design.
Public/Granted literature
- US20190266305A1 PLACEMENT-DRIVEN GENERATION OF ERROR DETECTING STRUCTURES IN INTEGRATED CIRCUITS Public/Granted day:2019-08-29
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