Invention Grant
- Patent Title: Method for manufacturing semiconductor device
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Application No.: US16206788Application Date: 2018-11-30
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Publication No.: US10957545B2Publication Date: 2021-03-23
- Inventor: Jia-Ming Lin , Shiu-Ko Jangjian , Chun-Che Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01L21/28 ; H01L21/768 ; H01L29/66 ; H01L29/49 ; H01L29/51

Abstract:
A method includes etching a dummy gate to form an opening. A gate dielectric layer is deposited in the opening. A blocking layer is deposited over the gate dielectric layer, wherein the blocking layer has a bottom portion over a bottom of the opening and a sidewall portion over a sidewall of the opening. An adhesive layer is deposited over the bottom portion of the blocking layer. A metal layer is deposited over the adhesive layer, wherein the metal layer is in contact with the sidewall portion of the blocking layer.
Public/Granted literature
- US20190115220A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2019-04-18
Information query
IPC分类: