Invention Grant
- Patent Title: Inspection apparatus, inspection method, and inverter apparatus
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Application No.: US16112580Application Date: 2018-08-24
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Publication No.: US10958157B2Publication Date: 2021-03-23
- Inventor: Shigen Yasunaka , Shinji Takakura
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- Priority: JPJP2018-51223 20180319
- Main IPC: H02P25/22
- IPC: H02P25/22 ; H02P23/14 ; H02P21/14 ; H02M1/32 ; H02M7/5387 ; G01R31/42 ; H02P27/06

Abstract:
According to an embodiment, an inspection apparatus inspects an inverter circuit including three pairs of arms. The apparatus includes a current controller and a control signal generator. The current controller generates a control output for controlling a current to be output by the inverter circuit. The control output enables the current to approach a target value of the current. The control signal generator generates a first control signal for controlling ON/OFF of a first arm as one of the three pairs of arms based on the control output, a second control signal for fixing a second arm paired with the first arm, in an OFF-state, and a third control signal for fixing at least part of arms other than the first arm and the second arm in an ON-state.
Public/Granted literature
- US20190288596A1 INSPECTION APPARATUS, INSPECTION METHOD, AND INVERTER APPARATUS Public/Granted day:2019-09-19
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