Invention Grant
- Patent Title: Characterizing a sample by material basis decomposition
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Application No.: US15181882Application Date: 2016-06-14
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Publication No.: US10969220B2Publication Date: 2021-04-06
- Inventor: Andrea Brambilla , Alexia Gorecki , Alexandra Potop
- Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives
- Applicant Address: FR Paris
- Assignee: Commissariat a L'Energie Atomique et aux Energies Alternatives
- Current Assignee: Commissariat a L'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1555438 20150615
- Main IPC: G01B5/02
- IPC: G01B5/02 ; G01B7/02 ; G01B11/02 ; G01B13/02 ; G01B15/02 ; G01N23/02 ; G01N23/087

Abstract:
A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (Sech) transmitted through this sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra (sbase(Lk; Lt)) calculating a likelihood from said calibration spectrum (Sbase(Lk; Lt)), and from the spectrum transmitted through the sample (Sech), each calibration spectrum (Sbase(Lk; Lt)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; estimating the characteristic thicknesses (L1, L2) associated with the sample according to the criterion of maximum likelihood.
Public/Granted literature
- US20160363442A1 CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION Public/Granted day:2016-12-15
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