Invention Grant
- Patent Title: Spectroscopic inspection method, image processing apparatus, and robot system
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Application No.: US16798791Application Date: 2020-02-24
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Publication No.: US10969278B2Publication Date: 2021-04-06
- Inventor: Seiji Aiso
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JPJP2019-031339 20190225
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G06T7/00

Abstract:
A spectroscopic inspection method is a spectroscopic inspection method of performing an inspection using a spectral image, including an imaging step of executing imaging processing of imaging an object within an imaging range of a spectral camera using the spectral camera and acquiring the spectral image, an inspection step of executing inspection processing of executing imaging processing on the spectral image and outputting a result of the image processing as an inspection result, a signal transmission step of executing transmission processing of transmitting a signal for operation of the object based on the inspection result, and a setting step of setting a work procedure of the imaging processing, the inspection processing, and the signal transmission processing, wherein the setting step sets the work procedure to execute the inspection step after the imaging step ends and execute the signal transmission step after the imaging step ends and before the inspection step ends.
Public/Granted literature
- US20200271519A1 Spectroscopic Inspection Method, Image Processing Apparatus, And Robot System Public/Granted day:2020-08-27
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