Invention Grant
- Patent Title: Measuring method, measuring arrangement and measuring device
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Application No.: US16316327Application Date: 2017-07-05
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Publication No.: US10969343B2Publication Date: 2021-04-06
- Inventor: Markku Mäntylä
- Applicant: VALMET AUTOMATION OY
- Applicant Address: FI Espoo
- Assignee: VALMET AUTOMATION OY
- Current Assignee: VALMET AUTOMATION OY
- Current Assignee Address: FI Espoo
- Agency: Oliff PLC
- Priority: FI20165587 20160713
- International Application: PCT/FI2017/050508 WO 20170705
- International Announcement: WO2018/011465 WO 20180118
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/892 ; G01N21/84 ; D21H19/32 ; G01B11/30 ; D21H27/00

Abstract:
A measuring method includes: illuminating a silicone-coated layer using a light source; and imaging light from the light source that is specularly reflected from the silicone-coated layer to form an image of a surface of the silicone-coated layer. The method further includes detecting pores and/or voids in a silicone coating of the silicone-coated layer from the image; determining a silicone coverage of the silicone-coated layer based on the detected pores and/or voids; and determining a release force of the silicone-coated layer based on the silicone coverage.
Public/Granted literature
- US20190277768A1 MEASURING METHOD, MEASURING ARRANGEMENT AND MEASURING DEVICE Public/Granted day:2019-09-12
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