Invention Grant
- Patent Title: X-ray product quality automatic inspection device
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Application No.: US14901989Application Date: 2015-08-27
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Publication No.: US10969346B2Publication Date: 2021-04-06
- Inventor: Huaping Tang , Zhiqiang Chen , Yuanjing Li , Zhuoyan Liu , Yonggang Wang , Zhanfeng Qin
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Beijing
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: CN201410442128.3 20140902
- International Application: PCT/CN2015/088258 WO 20150827
- International Announcement: WO2016/034073 WO 20160310
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/046 ; B07C5/34

Abstract:
An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.
Public/Granted literature
- US20160223474A1 X-RAY PRODUCT QUALITY AUTOMATIC INSPECTION DEVICE Public/Granted day:2016-08-04
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