Invention Grant
- Patent Title: Device and method for measuring in-situ time-resolved X-ray absorption spectrum
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Application No.: US16569570Application Date: 2019-09-12
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Publication No.: US10969348B2Publication Date: 2021-04-06
- Inventor: Jianda Shao , Shijie Liu , Shenghao Wang
- Applicant: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Applicant Address: CN Shanghai
- Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Current Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Current Assignee Address: CN Shanghai
- Agency: Mei & Mark LLP
- Agent Mann Li
- Priority: CN201710312948.4 20170505
- Main IPC: G01N23/083
- IPC: G01N23/083

Abstract:
Device and method for measuring in-situ time-resolved X-ray absorption spectrum. The device comprises an X-ray source, a first slit, an acousto-optic tunable X-ray filter, a radio frequency transmitter, a second slit, a front ionization chamber, a front ionization chamber signal amplifier, a sample to be tested, a rear ionization chamber, a rear ionization chamber signal amplifier, a data collector, and a computer. The X-ray source, the acousto-optic tunable X-ray filter, and the radio frequency transmitter are used to generate a monochromatic X-ray beam; the front ionization chamber is used to measure the intensity of the X-ray beam before passing through the sample; the rear ionization chamber is used to measure the intensity of the X-ray beam after passing through the sample; the front ionization chamber signal amplifier, the rear ionization chamber signal amplifier, the data collector, and the computer are used for data acquisition and data processing.
Public/Granted literature
- US20200003706A1 DEVICE AND METHOD FOR MEASURING IN-SITU TIME-RESOLVED X-RAY ABSORPTION SPECTRUM Public/Granted day:2020-01-02
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