Invention Grant
- Patent Title: Test system and method for testing a device under test having several communication lanes
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Application No.: US16162149Application Date: 2018-10-16
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Publication No.: US10969455B2Publication Date: 2021-04-06
- Inventor: Yi Jin , Kok Meng Wong , Johann Tost
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R31/319

Abstract:
A test system for testing a device under test that includes several communication lanes is described. The test system is a communication lane test system that includes a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument includes s a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that includes s several communication lanes is described.
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