Invention Grant
- Patent Title: Automated MisTie analysis and correction across two-dimensional (“2D”) seismic surveys
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Application No.: US15748328Application Date: 2017-08-22
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Publication No.: US10969508B2Publication Date: 2021-04-06
- Inventor: Nam Xuan Nguyen , William John May , Eugene Carey Heinrichs
- Applicant: Landmark Graphics Corporation
- Applicant Address: US TX Houston
- Assignee: Landmark Graphics Corporation
- Current Assignee: Landmark Graphics Corporation
- Current Assignee Address: US TX Houston
- Agency: Haynes and Boone, LLP
- International Application: PCT/US2017/047952 WO 20170822
- International Announcement: WO2018/093432 WO 20180524
- Main IPC: G01V1/36
- IPC: G01V1/36 ; G01V1/30
Abstract:
Systems and methods to correct misties across multiple 2D seismic surveys using a correction solution calculated based only on the intersecting points between different surveys.
Public/Granted literature
- US20200088899A1 Automated MisTie Analysis And Correction Across Two-Dimensional ("2D") Seismic Surveys Public/Granted day:2020-03-19
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