Invention Grant
- Patent Title: CVD apparatus with multi-zone thickness control
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Application No.: US16532726Application Date: 2019-08-06
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Publication No.: US10975473B2Publication Date: 2021-04-13
- Inventor: Chung-Wei Fang , Yi Hsun Chiu , Cho-Han Li , Yao Fong Dai
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Potashnik, LLC
- Main IPC: C23C16/52
- IPC: C23C16/52 ; H01L21/02 ; C23C16/455 ; H01L21/3105 ; H01L21/66 ; C23C16/56 ; C23C16/44

Abstract:
The present disclosure relates to a chemical vapor deposition apparatus and associated methods. In some embodiments, the CVD apparatus has a vacuum chamber and a gas import having a gas import axis through which a process gas is imported into the vacuum chamber and being arranged near an upper region of the vacuum chamber. At least one exhaust port is arranged near a bottom region of the vacuum chamber. The CVD apparatus also has a shower head arranged under the gas import having a plurality of holes formed there through. The shower head redistributes the process gas to form a precursor material with an uneven thickness that matches a remove profile of a subsequent CMP process. As a result, planarity of the formed layer after the CMP process is improved.
Information query
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