Invention Grant
- Patent Title: Analysis system
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Application No.: US16564078Application Date: 2019-09-09
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Publication No.: US10976264B2Publication Date: 2021-04-13
- Inventor: Shun Hirao
- Applicant: KABUSHIKI KAISHA TOSHIBA , TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
- Applicant Address: JP Tokyo; JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
- Current Assignee Address: JP Tokyo; JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- Priority: JP2019-048395 20190315
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G01N21/95 ; G06T7/00 ; G01N21/956

Abstract:
According to one embodiment, an analysis system includes a display controller. The display controller is configured to display a first comprehensive image and a first individual image from a plurality of workpiece data. The plurality of workpiece data relate to a plurality of workpieces, are classified into a plurality of categories, and are classified into one of a plurality of classes. The first comprehensive image is based on the plurality of workpiece data. The first individual image is based on a part of the plurality of workpiece data classified into one of the plurality of categories.
Public/Granted literature
- US20200292469A1 ANALYSIS SYSTEM Public/Granted day:2020-09-17
Information query
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