Invention Grant
- Patent Title: X-ray spectrometer system
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Application No.: US16226467Application Date: 2018-12-19
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Publication No.: US10976273B2Publication Date: 2021-04-13
- Inventor: Wenbing Yun , Srivatsan Seshadri , Janos Kirz , Sylvia Jia Yun Lewis
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N23/087 ; G01N23/223 ; G21K1/06 ; H01J35/08 ; H01J35/14 ; H01J35/18

Abstract:
An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.
Public/Granted literature
- US20190145917A1 X-RAY TRANSMISSION SPECTROMETER SYSTEM Public/Granted day:2019-05-16
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