Invention Grant
- Patent Title: Interference monitoring device
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Application No.: US16393105Application Date: 2019-04-24
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Publication No.: US10976717B2Publication Date: 2021-04-13
- Inventor: Yasuhito Ishikawa
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2018-086741 20180427
- Main IPC: G05B19/31
- IPC: G05B19/31 ; G05B19/4097 ; G05B19/404

Abstract:
The interference monitoring device comprises: an advanced position calculation unit that calculates an advanced position of the tool or the workpiece ahead by a predetermined period of time based on the program; an interference check unit that draws an estimated shape of a machined part of the workpiece after machining based on the advanced position, and makes the interference check based on the estimated shape of the machined part of the workpiece in the drawing; and an uncut region calculation unit that calculates an error between the estimated shape of the machined part of the workpiece in the drawing and an actual shape of the machined part of the workpiece after machining as an uncut region in the estimated shape of the machined part of the workpiece in the drawing. The interference check unit does not make the interference check in the uncut region.
Public/Granted literature
- US20190332083A1 INTERFERENCE MONITORING DEVICE Public/Granted day:2019-10-31
Information query
IPC分类: