Circuit testing and manufacture using multiple timing libraries
Abstract:
A method and system for manufacturing a circuit is disclosed. In some embodiments, the system includes: at least one processor configured to: generate a first timing library for a first set of circuit elements for a first set of input parameters based on device characteristics for each of the circuit elements in the first set of circuit elements, and storing the determined device characteristics in a database; and generating a second timing library for a second set of circuit elements for a second set of input parameters based on device characteristics previously stored in the database for a first subset of the second set of circuit elements and determining device characteristics for a second subset of the second set of circuit elements using one of an aging simulation or a stress simulation; and a circuit generation system, coupled to the at least one processor, the circuit generation system configured to form a circuit on a substrate, wherein the circuit includes at least one of the first set of circuit elements or the second set of circuit elements.
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