Invention Grant
- Patent Title: Reading method of resistive memory device
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Application No.: US16669245Application Date: 2019-10-30
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Publication No.: US10978147B2Publication Date: 2021-04-13
- Inventor: Hyung Dong Lee , Tae Hoon Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon
- Priority: KR10-2019-0052466 20190503
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/16

Abstract:
An electronic device includes a semiconductor memory. The semiconductor memory includes a bit line, a word line crossing the bit line, and a memory cell coupled to and disposed between the bit line and the word line. In a read operation, when the word line, which is in a precharged state, is floated, the bit line is driven to increase a voltage level of the bit line, and stopped when the memory cell is turned on.
Public/Granted literature
- US20200350009A1 ELECTRONIC DEVICE AND METHOD OF OPERATING THE ELECTRONIC DEVICE Public/Granted day:2020-11-05
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