Invention Grant
- Patent Title: Mitigating grown bad blocks
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Application No.: US16236792Application Date: 2018-12-31
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Publication No.: US10978160B2Publication Date: 2021-04-13
- Inventor: Jianzhi Wu , Xiang Yang , Jun Wan
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Volpe Koenig
- Main IPC: G11C16/16
- IPC: G11C16/16 ; G11C29/00 ; G06F3/06 ; G06F12/02

Abstract:
Example techniques that mitigate against memory hole shorts during an erase operation for memory cells in a string include an example method in which, during an erase operation, erase pulses are applied to the word lines of the memory string and terminated at different times based. In some instances, the erase pulses applied to the word lines of the memory string are terminated based on the temperature of the memory cells of the memory string. In further implementations, the erase pulses applied to the word lines of the memory string are boosted for different times depending on the location of the word line along the memory string during the erase operation.
Public/Granted literature
- US20200211652A1 Mitigating Grown Bad Blocks Public/Granted day:2020-07-02
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