Invention Grant
- Patent Title: Method for manufacturing a semiconductor device
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Application No.: US16408058Application Date: 2019-05-09
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Publication No.: US10978308B2Publication Date: 2021-04-13
- Inventor: Masaaki Kanazawa
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JPJP2018-104784 20180531
- Main IPC: H01L21/308
- IPC: H01L21/308 ; H01L29/66 ; H01L21/033 ; H01L21/768

Abstract:
method of manufacturing a semiconductor device capable of manufacturing a miniaturized semiconductor device is provided. The method of manufacturing a semiconductor device according to an embodiment includes the steps of: preparing a semiconductor substrate having a first surface and a second surface which is an opposite surface of the first surface; forming a hard mask having an opening on the first surface; forming a gate trench extending toward the second surface on the first surface using the hard mask as a mask; widening the width of the opening; filling the opening with an interlayer insulating film; and forming a contact hole in the interlayer insulating film by removing the hard mask.
Information query
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