- Patent Title: Abnormality factor determination apparatus, degradation determination apparatus, computer program, degradation determining method, and abnormality factor determining method
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Application No.: US16981845Application Date: 2019-03-14
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Publication No.: US10996282B2Publication Date: 2021-05-04
- Inventor: Nan Ukumori
- Applicant: GS Yuasa International Ltd.
- Applicant Address: JP Kyoto
- Assignee: GS Yuasa International Ltd.
- Current Assignee: GS Yuasa International Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Alston & Bird LLP
- Priority: JPJP2018-053015 20180320
- International Application: PCT/JP2019/010542 WO 20190314
- International Announcement: WO2019/181727 WO 20190926
- Main IPC: G01R31/392
- IPC: G01R31/392 ; G01R31/3842 ; G06N20/00 ; G01R31/367 ; G01R31/374 ; H01M10/42 ; H01M10/48 ; H02J3/32 ; H02J3/38
Abstract:
This abnormal factor determination device is provided with a measured value acquisition unit which acquires measured values including electric values and temperature values of multiple power storage elements, a predicted value acquisition unit which acquires predicted values including electric values and temperature values of multiple power storage elements, and a determination unit which, on the basis of the acquired measured values and predicted values, determines whether or not there are abnormal factors in the power storage system.
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