Invention Grant
- Patent Title: Systems and methods for waveform optimization for oblique scans
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Application No.: US16109560Application Date: 2018-08-22
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Publication No.: US10996299B2Publication Date: 2021-05-04
- Inventor: Ali Ersoz
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: McCoy Russell LLP
- Main IPC: G01R33/385
- IPC: G01R33/385 ; G01R33/54

Abstract:
Methods and systems are provided for optimizing gradient waveforms for oblique imaging. In one embodiment, a method comprises generating initial gradient waveforms in logical axes, evaluating area demand of each of the initial gradient waveforms, increasing a maximum amplitude of the initial gradient waveform in a first logical axis, reducing a maximum amplitude of the initial gradient waveform in a second logical axis, wherein the area demand in the first logical axis is greater than the area demand in the second logical axis, converting the gradient waveforms to physical gradient waveforms, and driving physical amplifiers of an imaging system with the physical gradient waveforms during a scan. In this way, oblique scans may be performed without a performance reduction caused by increases in echo time, repetition time, and echo spacing.
Public/Granted literature
- US20200064426A1 SYSTEMS AND METHODS FOR WAVEFORM OPTIMIZATION FOR OBLIQUE SCANS Public/Granted day:2020-02-27
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