Invention Grant
- Patent Title: Apparatus and method for authentication of electronic device test stations
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Application No.: US15954680Application Date: 2018-04-17
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Publication No.: US10996308B2Publication Date: 2021-05-04
- Inventor: Chi Wah Cheng , Yu Sze Cheung
- Applicant: ASM Technology Singapore Pte Ltd
- Applicant Address: SG Singapore
- Assignee: ASM Technology Singapore Pte Ltd
- Current Assignee: ASM Technology Singapore Pte Ltd
- Current Assignee Address: SG Singapore
- Agency: Ostrolenk Faber LLP
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R1/04 ; G01R31/28

Abstract:
A testing apparatus and a method for testing electronic devices is provided. The apparatus comprising a plurality of detachably mountable test stations which are operative to perform tests on the electronic devices and a plurality of pick heads for conveying the electronic devices to at least one of the plurality of test stations for testing. The apparatus further comprises an identification element incorporated in each test station indicating a characteristic of the test station, and an identification element detector movable relative to the plurality of test stations, the identification element detector being operative to identify and authenticate the characteristic of the at least one test station by detecting the identification element incorporated in the test station, prior to utilizing the test station for testing the electronic devices.
Public/Granted literature
- US20190317174A1 APPARATUS AND METHOD FOR AUTHENTICATION OF ELECTRONIC DEVICE TEST STATIONS Public/Granted day:2019-10-17
Information query