Invention Grant
- Patent Title: Manufacturing equipment diagnosis support system
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Application No.: US15308011Application Date: 2014-05-20
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Publication No.: US10996662B2Publication Date: 2021-05-04
- Inventor: Hiroyuki Imanari , Kazuhiro Ohara
- Applicant: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Applicant Address: JP Chuo-ku
- Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee Address: JP Chuo-ku
- Agency: Xsensus LLP
- International Application: PCT/JP2014/063359 WO 20140520
- International Announcement: WO2015/177870 WO 20151126
- Main IPC: G05B23/02
- IPC: G05B23/02

Abstract:
A manufacturing equipment diagnosis support system includes: a data collector which collects and records respective data in plural apparatuses to be monitored provided in manufacturing equipment; a data analysis device; and a display. The data analysis device includes: a data analysis range setting unit which sets an analysis range of data, by an item of data and time period; a data grouping unit which classifies the data into a category based on specification and use condition of the apparatus to be monitored, and a category based on a physical quantity which the data shows, to group the data; a feature extracting unit which extracts a feature in each of the data items; an unusual phenomenon specifying unit which specifies an unusual phenomenon candidate item; and a testing unit which tests whether there is a significant difference or not between the unusual phenomenon candidate item and an other data item.
Public/Granted literature
- US20170083016A1 MANUFACTURING EQUIPMENT DIAGNOSIS SUPPORT SYSTEM Public/Granted day:2017-03-23
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