Invention Grant
- Patent Title: In-system scan test of chips in an emulation system
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Application No.: US16721543Application Date: 2019-12-19
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Publication No.: US10997343B1Publication Date: 2021-05-04
- Inventor: Mitchell Poplack , Xiaolei Guo , Phung Truong , Justin Schmelzer
- Applicant: CADENCE DESIGN SYSTEMS, INC.
- Applicant Address: US CA San Jose
- Assignee: CADENCE DESIGN SYSTEMS, INC.
- Current Assignee: CADENCE DESIGN SYSTEMS, INC.
- Current Assignee Address: US CA San Jose
- Agency: Foley & Lardner LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01R31/00 ; G06F11/00 ; G06F30/343 ; G01R31/3177 ; G06F30/331 ; G06F11/26 ; G06F9/455 ; G01R31/3185

Abstract:
An emulation system may include an emulator. The emulator may include at least one chip and at least one FPGA. The chip may be associated with the FPGA. The FPGA may operate as a coprocessor to implement in-system scan test of the chip. In a scan mode of the in-system scan test, the coprocessor may transmit one or more in-system test instructions to the chip through its existing connections with the chip. The coprocessor may capture test response data from the chip in response to the one or more in-system test instructions through its existing connections with the chip. In an offline mode, the coprocessor may compare the test response data with expected response data to determine if the chips are functioning correctly.
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