Invention Grant
- Patent Title: Systems and methods for predicting persistent memory device degradation based on operational parameters
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Application No.: US15843075Application Date: 2017-12-15
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Publication No.: US10997516B2Publication Date: 2021-05-04
- Inventor: Viswanath Ponnuru , K. N. Ravishankar , Parmeshwr Prasad
- Applicant: Dell Products L.P.
- Applicant Address: US TX Round Rock
- Assignee: Dell Products L.P.
- Current Assignee: Dell Products L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Jackson Walker L.L.P.
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06N7/00 ; G06F3/06 ; G11C29/52 ; G06F11/10 ; G11C5/04 ; G11C7/04 ; G11C29/04

Abstract:
In accordance with embodiments of the present disclosure, an information handling system may include a processor, a memory system communicatively coupled to the processor, the memory system comprising one or more persistent memory modules, each of the one or more persistent memory modules comprising a volatile memory and a non-volatile memory, and a management controller communicatively coupled to the processor and the memory system. The management controller may be configured to correlate temperature sensor information with one or more other operational parameters associated with the one or more persistent memory modules and predict a likelihood of degradation of the one or more persistent memory modules based on correlation of the temperature sensor information with the one or more other operational parameters.
Public/Granted literature
- US20190188589A1 SYSTEMS AND METHODS FOR PREDICTING PERSISTENT MEMORY DEVICE DEGRADATION BASED ON OPERATIONAL PARAMETERS Public/Granted day:2019-06-20
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