Invention Grant
- Patent Title: Appearance inspection device
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Application No.: US16175837Application Date: 2018-10-31
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Publication No.: US10997711B2Publication Date: 2021-05-04
- Inventor: Keisuke Watanabe
- Applicant: FANUC Corporation
- Applicant Address: JP Yamanashi
- Assignee: FANUC Corporation
- Current Assignee: FANUC Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: JPJP2017-222176 20171117
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
An appearance inspection device creates a combination of a first image which is a normal product image and a second image which is a product image as a comparison object, on the basis of a reference data set and a learning data set, and a machine learning device learns classification of a product corresponding to the second image as normal or not normal for the combination. The machine learning device observes the combination of the first image and the second image as a state variable representing a current state of an environment, acquires a label given to the second image as label data, and performs learning by associating the state variable with the label data.
Public/Granted literature
- US20190156474A1 APPEARANCE INSPECTION DEVICE Public/Granted day:2019-05-23
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