Invention Grant
- Patent Title: Three-dimensional-shape measurement device, three-dimensional-shape measurement method, and program
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Application No.: US16483760Application Date: 2017-11-28
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Publication No.: US10997738B2Publication Date: 2021-05-04
- Inventor: Yasuhiro Ohnishi , Takashi Shimizu
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Metrolex IP Law Group, PLLC
- Priority: JPJP2017-043722 20170308
- International Application: PCT/JP2017/042486 WO 20171128
- International Announcement: WO2018/163529 WO 20180913
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/521 ; G01B11/16 ; G01B11/25

Abstract:
A control device acquires a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies, as observation signals for a measurement point on a measurement object. The control device repeatedly executes processing for estimating two component signals included in each observation signal, so as to separate the observation signal into two component signals, and calculate a three-dimensional position of the measurement point based on the phases of the separated component signals.
Public/Granted literature
- US20190392599A1 THREE-DIMENSIONAL-SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL-SHAPE MEASUREMENT METHOD, AND PROGRAM Public/Granted day:2019-12-26
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