Invention Grant
- Patent Title: Apparatuses and methods for reducing access device sub-threshold leakage in semiconductor devices
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Application No.: US16543240Application Date: 2019-08-16
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Publication No.: US10998022B2Publication Date: 2021-05-04
- Inventor: Boon Hor Lam , Shawn M. Hilde , Karl L. Major , Travis Marley
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C8/00
- IPC: G11C8/00 ; G11C8/08 ; G11C8/10 ; G11C11/406 ; G11C11/408

Abstract:
In some examples, an inactive word line voltage control (IWVC) circuit may be configured to provide a respective subword driver associated with a memory bank of a plurality of memory banks a non-active potential from a default off-state word line voltage (VNWL) to a reduced voltage VNWL lower than the default VNWL following a time duration after activating the memory bank. The IWVC circuit may also be configured to provide the respective subword driver with the default VNWL responsive to precharging the memory bank. The IWVC circuit may include a multiplexer coupled to the subword driver and configured to provide the default VNWL or the reduced voltage VNWL to the respective subword driver responsive to a VNWL control signal. The IWVC circuit may also include a time control circuit configured to provide the VNWL control signal responsive to a clock signal and a time control signal.
Public/Granted literature
- US20210050042A1 APPARATUSES AND METHODS FOR REDUCING ACCESS DEVICE SUB-THRESHOLD LEAKAGE IN SEMICONDUCTOR DEVICES Public/Granted day:2021-02-18
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