Invention Grant
- Patent Title: Systems and methods of control for plasma processing
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Application No.: US16221971Application Date: 2018-12-17
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Publication No.: US10998169B2Publication Date: 2021-05-04
- Inventor: Peter Ventzek , Zhiying Chen , Alok Ranjan
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- Main IPC: C23C16/455
- IPC: C23C16/455 ; H01L21/3065 ; H01L21/67 ; H01L21/683 ; H01J37/32

Abstract:
A method of plasma processing includes generating a first sequence of source power pulses, generating a second sequence of bias power pulses, combining the bias power pulses of the second sequence with the source power pulses of the first sequence to form a combined sequence of alternating source power pulses and bias power pulses, and, using the combined sequence, generating a plasma comprising ions and processing a substrate by delivering the ions to a major surface of the substrate.
Public/Granted literature
- US20200058470A1 SYSTEMS AND METHODS OF CONTROL FOR PLASMA PROCESSING Public/Granted day:2020-02-20
Information query
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