Invention Grant
- Patent Title: Correction method of detection signal value in spectrophotometer and spectrophotometer having correction function of detection signal value
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Application No.: US16266132Application Date: 2019-02-04
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Publication No.: US11002604B2Publication Date: 2021-05-11
- Inventor: Masato Watanabe
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Main IPC: G01J3/18
- IPC: G01J3/18 ; G01J3/28 ; G01J3/02

Abstract:
The purpose is to reduce the influence on the measurement due to high order diffracted light without arranging a filter for removing high order diffracted light between a diffraction grating and a PDA. The correction method includes a correction coefficient determination step of determining a correction coefficient related to a ratio of a portion of a detection signal value to the detection signal value, the portion of the detection signal value being derived from a second order diffracted light of light in the first wavelength range contained in the detection signal value of a long wavelength side photodiode for detecting light in the second wavelength range in the photodiode array, and a correction unit configured to obtain a corrected detection signal value derived from light in the second wavelength range from a different detection signal value of the long wavelength side photodiode by using the correction coefficient determined by the correction coefficient determination step.
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