Invention Grant
- Patent Title: Scattering estimation method and image processor
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Application No.: US16627151Application Date: 2017-07-25
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Publication No.: US11002866B2Publication Date: 2021-05-11
- Inventor: Yoshiyuki Yamakawa
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- International Application: PCT/JP2017/026917 WO 20170725
- International Announcement: WO2019/021376 WO 20190131
- Main IPC: G01T1/29
- IPC: G01T1/29 ; G06T11/00 ; A61B6/00
Abstract:
A scattering estimation method includes determining a convolution kernel for smoothing a single scattering distribution based on a scattered radiation index value (R) of a radioactive image (5) (S4) and fitting, to positron emission tomography measurement data, a scattering distribution smoothed by applying the convolution kernel to the single scattering distribution (S5).
Public/Granted literature
- US20200174144A1 Scattering Estimation Method and Image Processor Public/Granted day:2020-06-04
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